NIE, Xin, and Chuan-yi YU , trans. “Few-Shot Learning for Industrial Defect Detection Using Meta-Learning Techniques”. International Journal of Scientific Research and Management (IJSRM) 13, no. 06 (June 24, 2025): 2301–2318. Accessed July 1, 2025. https://www.ijsrm.net/index.php/ijsrm/article/view/6468.