ISSN (Online): 2321-3418
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Xin NIE

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๐Ÿ“Š Impact Overview
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Few-Shot Learning for Industrial Defect Detection Using Meta-Learning Techniques
๐Ÿ“– International Journal of Scientific Research and Management (IJSRM)Vol. 13, No. 06pp. 2301-2318๐Ÿ—“ Jun 2025DOI โ†—
2.2K views4.4K downloads1 cited